Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation
The methodological approach of hammering multiple rows is newly proposed to evaluate today’s SDRAMs, employed with in-DRAM mitigation circuits.The multiple rows are selected based on the one-row hammering test (single row hammering without refresh commands) and are exploited to defeat the employed mitigation algorithm.We irradiated the targe